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Quantum enhancement of accuracy and precision in optical interferometry

机译:量子增强光学干涉测量的精度和精度

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摘要

White-light interferometry is one of today's most precise tools fordetermining optical material properties. Achievable precision and accuracy aretypically limited by systematic errors due to a high number of interdependentdata fitting parameters. Here, we introduce spectrally-resolved quantumwhite-light interferometry as a novel tool for optical property measurements,notably chromatic dispersion in optical fibres. By exploiting both spectral andphoton-number correlations of energy-time entangled photon pairs, the number offitting parameters is significantly reduced which eliminates systematic errorsand leads to an absolute determination of the material parameter. By comparingthe quantum method to state-of-the-art approaches, we demonstrate the quantumadvantage through 2.4 times better measurement precision, despite involving 62times less photons. The improved results are due to conceptual advantagesenabled by quantum optics which are likely to define new standards inexperimental methods for characterising optical materials.
机译:白光干涉测量法是当今确定光学材料特性的最精确工具之一。由于大量相互依赖的数据拟合参数,可达到的精度和准确性通常受到系统误差的限制。在这里,我们介绍光谱分辨的量子白光干涉测量法,将其作为光学性能测量的新工具,特别是光纤中的色散。通过利用能量时间纠缠光子对的光谱和光子数相关性,拟合参数的数量显着减少,这消除了系统误差并导致了材料参数的绝对确定。通过将量子方法与最先进的方法进行比较,尽管光子的数量减少了62倍,但我们通过2.4倍的测量精度证明了量子优势。改进的结果归因于量子光学所带来的概念优势,量子光学很可能为表征光学材料的实验方法定义新的标准。

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